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  2. Fault injection - Wikipedia

    en.wikipedia.org/wiki/Fault_injection

    Fault injection can take many forms. In the testing of operating systems for example, fault injection is often performed by a driver (kernel-mode software) that intercepts system calls (calls into the kernel) and randomly returning a failure for some of the calls. This type of fault injection is useful for testing low-level user-mode software.

  3. Bebugging - Wikipedia

    en.wikipedia.org/wiki/Bebugging

    These techniques worked by adding a number of known faults to a software system for the purpose of monitoring the rate of detection and removal. This assumed that it is possible to estimate the number of remaining faults in a software system still to be detected by a particular test methodology. Bebugging is a type of fault injection.

  4. Dependability - Wikipedia

    en.wikipedia.org/wiki/Dependability

    Fault injectionTesting how computer systems behave under unusual stresses; Fault tolerance – Resilience of systems to component failures or errors; Formal methods – Mathematical program specifications; List of system quality attributes – Non-functional requirements for system evaluation

  5. Software testing - Wikipedia

    en.wikipedia.org/wiki/Software_testing

    TestingCup – Polish Championship in Software Testing, Katowice, May 2016 Software testing is the act of checking whether software satisfies expectations.. Software testing can provide objective, independent information about the quality of software and the risk of its failure to a user or sponsor.

  6. Reliability, availability, maintainability and safety - Wikipedia

    en.wikipedia.org/wiki/Reliability,_availability...

    In engineering, reliability, availability, maintainability and safety (RAMS) [1] [2] is used to characterize a product or system: . Reliability: Ability to perform a specific function and may be given as design reliability or operational reliability

  7. Single-event upset - Wikipedia

    en.wikipedia.org/wiki/Single-event_upset

    In 1979, James Ziegler of IBM, along with W. Lanford of Yale, first described the mechanism whereby a sea-level cosmic ray could cause a single-event upset in electronics. 1979 also saw the world's first heavy ion "single-event effects" test at a particle accelerator facility, conducted at Lawrence Berkeley National Laboratory's 88-Inch ...

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  9. Failure mode and effects analysis - Wikipedia

    en.wikipedia.org/wiki/Failure_mode_and_effects...

    Fault tree analysis – Failure analysis system used in safety engineering and reliability engineering; Hazard analysis and critical control points – Systematic preventive approach to food safety; High availability – Systems with high up-time, a.k.a. "always on" List of materials analysis methods; List of materials-testing resources