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  2. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    Differential phase contrast (DPC) is an imaging mode which relies on the beam being deflected by electromagnetic fields. In the classical case, the fast electrons in the electron beam is deflected by the Lorentz force, as shown schematically for a magnetic field in the figure to

  3. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  4. Environmental scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Environmental_scanning...

    The signal thus picked up by the anode is further amplified and processed to modulate a display screen and form an image as in SEM. Notably, in this design and the associated gaseous electron amplification, the product p·d is an independent parameter, so that there is a wide range of values of pressure and electrode geometry which can be ...

  5. Electron channelling contrast imaging - Wikipedia

    en.wikipedia.org/wiki/Electron_channelling...

    Electron channelling contrast imaging (ECCI) is a scanning electron microscope (SEM) diffraction technique used in the study of defects in materials. These can be dislocations or stacking faults that are close to the surface of the sample, low angle grain boundaries or atomic steps.

  6. Scanning confocal electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_confocal_electron...

    High energies of incident particles (200 keV electrons vs. 2 eV photons) result in much higher spatial resolution of SCEM as compared to SCOM (lateral resolution <1 nm vs. >400 nm). As compared to conventional electron microscopy ( TEM , STEM , SEM ), SCEM offers 3-dimensional imaging. 3D imaging in SCEM was expected from the confocal geometry ...

  7. Electron beam-induced deposition - Wikipedia

    en.wikipedia.org/wiki/Electron_beam-induced...

    Only SEM-like imaging using secondary electrons is possible, and even that imaging is restricted to short observations due to sample damaging by the Ga + beam. The use of a dual beam instrument, that combines a FIB and an SEM in one, circumvents this limitation. The advantages of IBID are: Much higher deposition rate; Higher purity

  8. An IHOP server fed a man facing homelessness. She says she ...

    www.aol.com/ihop-server-fed-man-facing-203159367...

    A Florida IHOP employee who was fired after serving a homeless man said she was offered her job back, according to local media. Victoria Hughes has worked at an IHOP restaurant in Lakeland, Fla ...

  9. Contrast transfer function - Wikipedia

    en.wikipedia.org/wiki/Contrast_transfer_function

    Linear imaging theory assumes that the transmitted beam is dominant, there is only weak phase shift by the sample. In many cases, this precondition is not fulfilled. In order to account for these effects, non-linear imaging theory is required. With strongly scattering samples, diffracted electrons will not only interfere with the transmitted ...

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