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  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  3. Standard error - Wikipedia

    en.wikipedia.org/wiki/Standard_error

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  4. Environmental scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Environmental_scanning...

    The signal thus picked up by the anode is further amplified and processed to modulate a display screen and form an image as in SEM. Notably, in this design and the associated gaseous electron amplification, the product p·d is an independent parameter, so that there is a wide range of values of pressure and electrode geometry which can be ...

  5. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    These signals can be obtained simultaneously, allowing direct correlation of images and spectroscopic data. A typical STEM is a conventional transmission electron microscope equipped with additional scanning coils , detectors, and necessary circuitry, which allows it to switch between operating as a STEM, or a CTEM; however, dedicated STEMs are ...

  6. Scanning confocal electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_confocal_electron...

    Scanning confocal electron microscopy (SCEM) is an electron microscopy technique analogous to scanning confocal optical microscopy (SCOM). In this technique, the studied sample is illuminated by a focussed electron beam, as in other scanning microscopy techniques, such as scanning transmission electron microscopy or scanning electron microscopy.

  7. Electron backscatter diffraction - Wikipedia

    en.wikipedia.org/wiki/Electron_backscatter...

    Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In the microscope an ...

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  9. Security event management - Wikipedia

    en.wikipedia.org/wiki/Security_event_management

    Security event management (SEM), and the related SIM and SIEM, are computer security disciplines that use data inspection tools to centralize the storage and interpretation of logs or events generated by other software running on a network.