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  2. Worth 4 dot test - Wikipedia

    en.wikipedia.org/wiki/Worth_4_dot_test

    The Worth Four Light Test, also known as the Worth's four dot test or W4LT, is a clinical test mainly used for assessing a patient's degree of binocular vision and binocular single vision. Binocular vision involves an image being projected by each eye simultaneously into an area in space and being fused into a single image.

  3. Worldwide Harmonised Light Vehicles Test Procedure

    en.wikipedia.org/wiki/Worldwide_Harmonised_Light...

    The Worldwide Harmonised Light vehicles Test Procedure (WLTP) [1] is a global driving cycle standard for determining the levels of pollutants, CO 2 emission standards and fuel consumption of conventional internal combustion engine (ICE) and hybrid automobiles, as well as the all-electric range of plug-in electric vehicles.

  4. WFDT - Wikipedia

    en.wikipedia.org/?title=WFDT&redirect=no

    This page was last edited on 23 September 2008, at 09:44 (UTC).; Text is available under the Creative Commons Attribution-ShareAlike 4.0 License; additional terms may apply.

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  6. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.

  7. WRDF - Wikipedia

    en.wikipedia.org/wiki/WRDF

    The station signed on in October 1968 as WFDT, featuring a MOR music format. After a time as a soft AC station with the WKSY calls, the station changed to CHR/Top 40 in the late 1980s as WZRQ, but financial problems paired with low ratings eventually led to the station going off the air in August 1988.

  8. Watzke–Allen test - Wikipedia

    en.wikipedia.org/wiki/Watzke–Allen_test

    Watzke-Allen test (WAT) also known as Watzke-Allen slit beam test (WASBT) is a test used in the diagnosis of a macular hole, a condition affecting the macular region in the retina of the eye. The test is done by projecting a thin line of light over the macula with a slit lamp .

  9. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.