enow.com Web Search

Search results

1. Results from the WOW.Com Content Network

2. Test probe - Wikipedia

   en.wikipedia.org/wiki/Test_probe

   Typical passive oscilloscope probe being used to test an integrated circuit. A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods ...

3. Automatic test equipment - Wikipedia

   en.wikipedia.org/wiki/Automatic_test_equipment

   Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.

4. Dynamometer - Wikipedia

   en.wikipedia.org/wiki/Dynamometer

   A 'motoring' dynamometer provides the features of a brake dyno system, but in addition, can "power" (usually with an AC or DC motor) the PM and allow testing of very small power outputs (for example, duplicating speeds and loads that are experienced when operating a vehicle traveling downhill or during on/off throttle operations).

5. U.S. auto safety regulator opens two new probes into ... - AOL

   www.aol.com/u-auto-safety-regulator-opens...

   The U.S. auto safety regulator has opened two new probes into potential defects related to Ford vehicles. In separate releases issued Friday, the National Highway Traffic Safety Administration ...

6. Built-in self-test - Wikipedia

   en.wikipedia.org/wiki/Built-in_self-test

   Then, a periodic test will assure that the device has not become unsafe since the POST. Safety-critical devices normally define a "safety interval", a period of time too short for injury to occur. The self test of the most critical functions normally is completed at least once per safety interval. The periodic test is normally a subset of the POST.

7. Probe card - Wikipedia

   en.wikipedia.org/wiki/Probe_card

   Advanced Tester Resource Enhancement (ATRE) [5] is a powerful means of increasing the number of DUTs that can be tested by a probe card in parallel (or in one touchdown during which probe card needles remain in contact with the wafer DUTs). ATRE allows the sharing of tester resources among DUTs using active components, which have the ability to ...