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Compared with destructive techniques, e.g. three-dimensional electron backscatter diffraction (3D EBSD), [5] with which the sample is serially sectioned and imaged, 3DXRD and similar X-ray nondestructive techniques have the following advantages: They require less sample preparation, thus limiting the introduction of new structures in the sample.
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
X-ray powder diffraction fingerprinting has become the standard tool for the identification of single or multiple crystal phases and is widely used in such fields as metallurgy, mineralogy, forensic science, archeology, condensed matter physics, and the biological and pharmaceutical sciences.
Advances in X-ray Analysis—Technical articles on x-ray methods and analyses; Powder Diffraction Journal—quarterly journal published by the JCPDS-International Centre for Diffraction Data through the Cambridge University Press; Denver X-ray Conference—World's largest X-ray conference on the latest advancements in XRD and XRF; PPXRD-16 ...
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The number of error-free coordinates were taken as a percentage of structures for which 3D coordinates are present in the CSD. The significance of the structure factor files, mentioned above, is that, for CSD structures determined by X-ray diffraction that have a structure file, a crystallographer can verify the interpretation of the observed ...
XAS – X-ray absorption spectroscopy; X-CTR – X-ray crystal truncation rod scattering; X-ray crystallography; XDS – X-ray diffuse scattering; XES – X-ray emission spectroscopy; XPEEM – X-ray photoelectron emission microscopy; XPS – X-ray photoelectron spectroscopy; XRD – X-ray diffraction; XRES – X-ray resonant exchange scattering