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  2. Near-field scanning optical microscope - Wikipedia

    en.wikipedia.org/wiki/Near-field_scanning...

    Here, λ 0 is the wavelength in vacuum; NA is the numerical aperture for the optical component (maximum 1.3–1.4 for modern objectives with a very high magnification factor). Thus, the resolution limit is usually around λ 0 /2 for conventional optical microscopy. [17]

  3. Environmental scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Environmental_scanning...

    The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber.

  4. Scanning helium ion microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_Helium_Ion_Microscope

    In terms of imaging, SHIM has several advantages over the traditional scanning electron microscope (SEM). Owing to the very high source brightness, and the short De Broglie wavelength of the helium ions, which is inversely proportional to their momentum, it is possible to obtain qualitative data not achievable with conventional microscopes ...

  5. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  6. High-resolution transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/High-resolution...

    High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples. [ 1 ] [ 2 ] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2 -bonded carbon (e.g ...

  7. File:SEM Zoom.ogv - Wikipedia

    en.wikipedia.org/wiki/File:SEM_Zoom.ogv

    English: Scanning electron microscopes are capable of an extremely wide range of magnifications hard to visualise with a simple image, instead this video shows a zoom in from a typical low magnification to a high magnification. It starts at 25x, about 6 mm across the whole field of view, and zooms in to 12000x, about 12 μm across the whole ...

  8. Scanning electrochemical microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_electrochemical...

    Increases in the complexity of electrodes along with decreases in size have prompted the need for high resolution characterization techniques. Scanning electron microscopy (SEM), cyclic voltammetry (CV), and SECM approach curve measurements are frequently applied to identify the dimension and geometry of fabricated probes.

  9. Cathodoluminescence - Wikipedia

    en.wikipedia.org/wiki/Cathodoluminescence

    Thin section of quartz from a hydrothermal vein - left in CL and right in transmitted light. In geology, mineralogy, materials science and semiconductor engineering, a scanning electron microscope (SEM) fitted with a cathodoluminescence detector, or an optical cathodoluminescence microscope, may be used to examine internal structures of semiconductors, rocks, ceramics, glass, etc. in order to ...