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Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...
The impact of any latent fault tests, and The operational profile (environmental stress factors). Given a component database calibrated with field failure data that is reasonably accurate, [ 1 ] the method can predict device level failure rate per failure mode, useful life, automatic diagnostic effectiveness, and latent fault test effectiveness ...
graph with an example of steps in a failure mode and effects analysis. Failure mode and effects analysis (FMEA; often written with "failure modes" in plural) is the process of reviewing as many components, assemblies, and subsystems as possible to identify potential failure modes in a system and their causes and effects.
Fault detection coverage that system built-in test will realize; Whether the analysis will be functional or piece-part; Criteria to be considered (mission abort, safety, maintenance, etc.) System for uniquely identifying parts or functions; Severity category definitions
In the nominal, i.e. fault-free situation, the lower control loop operates to meet the control goals. The fault-detection (FDI) module monitors the closed-loop system to detect and isolate faults. The fault estimate is passed to the reconfiguration block, which modifies the control loop to reach the control goals in spite of the fault.
An alarm is a persistent indication of a fault that clears only when the triggering condition has been resolved. A current list of problems occurring on the network component is often kept in the form of an active alarm list such as is defined in RFC 3877, the Alarm MIB. A list of cleared faults is also maintained by most network management ...
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
Automatic correction is possible for redundant systems when fault-detection, fault-isolation, and fault-bypass are all automatic. Automatic corrective action is also called Active Recovery and Self Healing. This technique can be used to increase the MTBF to the length of time an item will be required to be used without maintenance.