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  2. Test probe - Wikipedia

    en.wikipedia.org/wiki/Test_probe

    Typical passive oscilloscope probe being used to test an integrated circuit. A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.

  3. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.

  4. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.

  5. Logic probe - Wikipedia

    en.wikipedia.org/wiki/Logic_probe

    Elenco LP-560 logic probe. It has a red LED for high state, green LED for low state, amber LED for pulsing state, and a changing audible tone. [1] A logic probe is a low-cost hand-held test probe used for analyzing and troubleshooting the logical states (boolean 0 or 1) of a digital circuit.

  6. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Advanced Tester Resource Enhancement (ATRE) [5] is a powerful means of increasing the number of DUTs that can be tested by a probe card in parallel (or in one touchdown during which probe card needles remain in contact with the wafer DUTs). ATRE allows the sharing of tester resources among DUTs using active components, which have the ability to ...

  7. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    The following are used for stimulus of the circuit under test: Power supplies; Signal generator; Digital pattern generator; Pulse generator; Voltcraft M-3850 portable multimeter. The following analyze the response of the circuit under test: Oscilloscope (Displays voltage as it changes over time) Frequency counter (Measures frequency)

  8. The Hardest Working Royal of 2024 Is... - AOL

    www.aol.com/hardest-working-royal-2024-160000744...

    Yui Mok - WPA Pool/Getty Images. Princess Anne secured the top spot, yet again, with 217 royal engagements and a 2.4% increase from 2023, according to the report.November was her busiest month ...

  9. Flying probe - Wikipedia

    en.wikipedia.org/wiki/Flying_probe

    A universal logic probe. Flying probes are test probes used for testing both bare circuit boards and boards loaded with components. Flying probes were introduced in the late 1980’s and can be found in many manufacturing and assembly operations, most often in manufacturing of electronic printed circuit boards.

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