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2. Test light - Wikipedia

   en.wikipedia.org/wiki/Test_light

   Neon-lamp type tester, which has no amplifier; this type requires a direct metallic contact to the circuit to be tested. Neon screwdriver test light in use. Current flows through a high ohm resistor and the lamp and the distributed capacitance and resistance of the user's body. A low-cost type of test lamp contacts only one side of the circuit ...

3. Electrical outlet tester - Wikipedia

   en.wikipedia.org/wiki/Electrical_outlet_tester

   A quick supplemental screening test for these simple miswiring errors can be performed using a non-contact voltage tester (NCVT) or non-contact voltage detector. [4] If a problem is thus identified, it can be investigated further using more-advanced equipment, or the outlet in question can be de-energized and disassembled for careful scrutiny. [4]

4. Non-contact wafer testing - Wikipedia

   en.wikipedia.org/wiki/Non-contact_wafer_testing

   the probe card may be damaged from repeated contact, or become contaminated with debris created by contact with the wafer [2] the probe will act as a circuit and affect the results of the test. For this reason, the tests performed at wafer sort cannot always be identical and as extensive as those performed at the final device test after ...

5. Eddy-current testing - Wikipedia

   en.wikipedia.org/wiki/Eddy-current_testing

   Variations in the electrical conductivity and magnetic permeability of the test object, and the presence of defects causes a change in eddy current and a corresponding change in phase and amplitude that can be detected by measuring the impedance changes in the coil, which is a telltale sign of the presence of defects. [5]

6. Circuit diagram - Wikipedia

   en.wikipedia.org/wiki/Circuit_diagram

   A circuit diagram (or: wiring diagram, electrical diagram, elementary diagram, electronic schematic) is a graphical representation of an electrical circuit. A pictorial circuit diagram uses simple images of components, while a schematic diagram shows the components and interconnections of the circuit using standardized symbolic representations.

7. Probe card - Wikipedia

   en.wikipedia.org/wiki/Probe_card

   Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available.

8. Current clamp - Wikipedia

   en.wikipedia.org/wiki/Current_clamp

   The Columbia tong test ammeter (illustrated) is an example of the iron vane type, used for measuring large AC currents up to 1000 amperes. The iron jaws of the meter direct the magnetic field surrounding the conductor to an iron vane that is attached to the needle of the meter.

9. Open-circuit test - Wikipedia

   en.wikipedia.org/wiki/Open-circuit_test

   Circuit diagram for open-circuit test. The open-circuit test, or no-load test, is one of the methods used in electrical engineering to determine the no-load impedance in the excitation branch of a transformer. The no load is represented by the open circuit, which is represented on the right side of the figure as the "hole" or incomplete part of ...