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Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...
Automatic test equipment, any apparatus that performs tests using automation; Built-in test equipment, passive fault management and diagnosis equipment built into airborne systems to support maintenance; On-board diagnostics, test equipment for automobiles; Transistor tester, used to test the electrical behavior of transistors and solid-state ...
Built-in test equipment includes multimeters, oscilloscopes, discharge probes, and frequency generators that are provided as part of the system to enable testing and perform diagnostics. The acronym BIT is often used for this same function or, more specifically, in reference to the individual tests. BIT often includes: The detection of the fault
An additional column may be added to an FMEDA spreadsheet and probability of detection for each component failure mode is estimated. The cumulative effectiveness of the proof test is calculated in the same way as automatic diagnostic coverage. FMEDA tools can also calculate latent fault effectiveness.
Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.
Condition monitoring techniques are normally used on rotating equipment, auxiliary systems and other machinery like belt-driven equipment, (compressors, pumps, electric motors, internal combustion engines, presses), while periodic inspection using non-destructive testing (NDT) techniques and fit for service (FFS) [1] evaluation are used for ...
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
The diagnostic algorithm uses an internal simulation of a fault model of the electrical circuit in order to compare the failure characteristics of the actual device with a set of simulated failure characteristics. Various fault types may be applied to the diagnostic model. Commonly used fault types are:
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