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Small-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes and characteristic distances of partially ordered materials. [1]
Nanoparticles differ in their physical properties such as size, shape, and dispersion, which must be measured to fully describe them. The characterization of nanoparticles is a branch of nanometrology that deals with the characterization, or measurement, of the physical and chemical properties of nanoparticles.,. [1]
A typical application of GISAS is the characterisation of self-assembly and self-organization on the nanoscale in thin films. Systems studied by GISAS include quantum dot arrays, [1] growth instabilities formed during in-situ growth, [2] self-organized nanostructures in thin films of block copolymers, [3] silica mesophases, [4] [5] and nanoparticles.
It is a sponsor of the Denver X-ray Conference and the Pharmaceutical Powder X-ray Diffraction Symposium. It also publishes the journals Advances in X-ray Analysis and Powder Diffraction. In 2019, Materials Data, also known as MDI, merged with ICDD.
It is an X-ray-diffraction [2] method and commonly used to determine a range of information about crystalline materials. The term WAXS is commonly used in polymer sciences to differentiate it from SAXS but many scientists doing "WAXS" would describe the measurements as Bragg/X-ray/powder diffraction or crystallography .
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.
Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [ 3 ] X-ray standing waves , another X-ray variant where the intensity decay into a sample from diffraction is used to analyze chemistry.
The use of computational methods for the powder X-ray diffraction data analysis is now generalized. It typically compares the experimental data to the simulated diffractogram of a model structure, taking into account the instrumental parameters, and refines the structural or microstructural parameters of the model using least squares based ...