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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
motofit is a program for analysing neutron and X-ray reflectometry data. OpenFilters is a program for designing optical filters. Py_matrix is an open source Python code that implements the transfer-matrix method for multilayers with arbitrary dielectric tensors. It was especially created for plasmonic and magnetoplasmonic calculations.
X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
An X-ray spectrograph consists of a high voltage power supply (50 kV or 100 kV), a broad band X-ray tube, usually with a tungsten anode and a beryllium window, a specimen holder, an analyzing crystal, a goniometer, and an X-ray detector device. These are arranged as shown in Fig. 1.
X-ray reflectivity, yet another related technique, but here the intensity of the specular reflected beam is measured. [ 6 ] [ 7 ] [ 8 ] Grazing incidence atom scattering, [ 9 ] [ 10 ] where the fact that atoms (and ions) can also be waves is used to diffract from surfaces.
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...
Anomalous X-ray scattering (MAD or SAD phasing) – the X-ray wavelength may be scanned past an absorption edge [a] of an atom, which changes the scattering in a known way. By recording full sets of reflections at three different wavelengths (far below, far above and in the middle of the absorption edge) one can solve for the substructure of ...
Then the xz plane is the interface, and the y axis is normal to the interface (see diagram). Let i and j (in bold roman type) be the unit vectors in the x and y directions, respectively. Let the plane of incidence be the xy plane (the plane of the page), with the angle of incidence θ i measured from j towards i.