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The formal definition of calibration by the International Bureau of Weights and Measures (BIPM) is the following: "Operation that, under specified conditions, in a first step, establishes a relation between the quantity values with measurement uncertainties provided by measurement standards and corresponding indications with associated measurement uncertainties (of the calibrated instrument or ...
Fluke Corporation is an American manufacturer of industrial test, measurement, and diagnostic equipment, including electronic test equipment. It was started in 1948 by John Fluke while he was employed at General Electric .
For example, if the meter is set to a range of 300 V full scale, the meter's impedance will be 6 MΩ. 20,000 Ω/V is the best (highest) sensitivity available for typical analog multimeters that lack internal amplifiers. For meters that do have internal amplifiers (VTVMs, FETVMs, etc.), the input impedance is fixed by the amplifier circuit.
An OTDR. An optical time-domain reflectometer (OTDR) is an optoelectronic instrument used to characterize an optical fiber.It is the optical equivalent of an electronic time domain reflectometer which measures the impedance of the cable or transmission line under test.
An LCR meter is a type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component. [1] In the simpler versions of this instrument the impedance was measured internally and converted for display to the corresponding capacitance or inductance value.
High Resolution Modular Time Interval Counter (PDF) (Technical report) Fundamentals of Time Interval Measurements (Application Note 200-3) (PDF) (Technical report). Electronic Counter Series. HP. Zhang, Victor S.; Davis, Dick D.; Lombardi, Michael A. (1994-12-01). High Resolution Time Interval Counter (PDF). The 26th Annual Precise Time and ...
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"Measurement of soil water content and electrical conductivity by time domain reflectometry: A review". Computers and Electronics in Agriculture 31:213–237. Pettinelli E., A. Cereti, A. Galli, and F. Bella, 2002. "Time domain reflectometry: Calibration techniques for accurate measurement of the dielectric properties of various materials".