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  2. Test engineer - Wikipedia

    en.wikipedia.org/wiki/Test_engineer

    Depending on the product, the machines that we are referring to could mean a combination of Automatic Test Equipment (ATE), handler, interface board, and test program that drives the ATE, as with the case of the IC chip testing. Test automation is a big part of a test engineer's job. The whole intention of automating the test is as follows:

  3. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.

  4. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...

  5. Test equipment - Wikipedia

    en.wikipedia.org/wiki/Test_equipment

    Automatic test equipment, any apparatus that performs tests using automation; Built-in test equipment, passive fault management and diagnosis equipment built into airborne systems to support maintenance; On-board diagnostics, test equipment for automobiles; Transistor tester, used to test the electrical behavior of transistors and solid-state ...

  6. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The common understanding of DFT in the context of Electronic Design Automation (EDA) for modern microelectronics is shaped to a large extent by the capabilities of commercial DFT software tools as well as by the expertise and experience of a professional community of DFT engineers researching, developing, and using such tools. Much of the ...

  7. Device under test - Wikipedia

    en.wikipedia.org/wiki/Device_under_test

    In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.

  8. Automation engineering - Wikipedia

    en.wikipedia.org/wiki/Automation_engineering

    Automation engineers are responsible for creating detailed design specifications and other documents, developing automation based on specific requirements for the process involved, and conforming to international standards like IEC-61508, local standards, and other process specific guidelines and specifications, simulate, test and commission ...

  9. List of IEC standards - Wikipedia

    en.wikipedia.org/wiki/List_of_IEC_standards

    IEC 62057-1 Electrical energy meters – Test equipment, techniques and procedures – Part 1: Stationary meter test units (MTUs) IEC 62057-3 Electrical energy meters – Test equipment, techniques and procedures – Part 3: Automatic meter testing system (AMTS) IEC 62058 Electricity metering equipment (AC) – Acceptance inspection