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Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
AFM has also been used to measure, in an aqueous environment, the dispersion force due to polymer adsorbed on the substrate. [17] Forces of the order of a few piconewtons can now be routinely measured with a vertical distance resolution of better than 0.1 nanometers. Force spectroscopy can be performed with either static or dynamic modes.
Figure 1: Photograph of an AFM system which can be used for chemical force microscopy. In materials science, chemical force microscopy (CFM) is a variation of atomic force microscopy (AFM) which has become a versatile tool for characterization of materials surfaces.
Looking back 130 years ago today, some of the most southernmost locations in the U.S. were buried in more than a foot of snow. In some spots, the weather was even stranger than this year's Winter ...
Chris Roberts took the stage at a backer-only pre-PAX event in Boston last night to show off some of Star Citizen's alpha dogfighting footage. Despite a few technical glitches, fans were able to ...
LAFD spokeswoman Margaret Stewart told KABC that firefighters are in a "much better place" than earlier in the evening because firefighters have been able to do multiple water drops from the air ...
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Electrochemical AFM (EC-AFM) is a particular type of Scanning probe microscopy (SPM), which combines the classical Atomic force microscopy (AFM) together with electrochemical measurements. EC-AFM allows to perform in-situ AFM measurements in an electrochemical cell , in order to investigate the actual changes in the electrode surface morphology ...