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  2. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  3. Stuck-at fault - Wikipedia

    en.wikipedia.org/wiki/Stuck-at_fault

    The test vector is a collection of bits to apply to the circuit's inputs, and a collection of bits expected at the circuit's output. If the gate pin under consideration is grounded, and this test vector is applied to the circuit, at least one of the output bits will not agree with the corresponding output bit in the test vector.

  4. Test compression - Wikipedia

    en.wikipedia.org/wiki/Test_compression

    Test compression is a technique used to reduce the time and cost of testing integrated circuits.The first ICs were tested with test vectors created by hand. It proved very difficult to get good coverage of potential faults, so Design for testability (DFT) based on scan and automatic test pattern generation (ATPG) were developed to explicitly test each gate and path in a design.

  5. Digital pattern generator - Wikipedia

    en.wikipedia.org/wiki/Digital_pattern_generator

    A digital pattern generator is a piece of electronic test equipment or software used to generate digital electronic stimuli. Digital electronics stimuli are a specific kind of electrical waveform varying between two conventional voltages that correspond to two logic states ("low state" and "high state", "0" and "1").

  6. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.

  7. Test vector - Wikipedia

    en.wikipedia.org/wiki/Test_vector

    In computer science and engineering, a test vector is a set of inputs provided to a system in order to test that system. In software development , test vectors are a methodology of software testing and software verification and validation .

  8. Far-left Antifa activists waiting to see Trump actions. How ...

    www.aol.com/far-left-antifa-activists-waiting...

    Buoyed by promised pardons of their brethren for their Jan. 6 crimes and by Trump’s embrace of popular extremist far-right figures, those groups will likely see a resurgence after January ...

  9. Arbitrary waveform generator - Wikipedia

    en.wikipedia.org/wiki/Arbitrary_waveform_generator

    The BK Precision model 4078 Dual Channel Arbitrary Waveform Generator uses direct digital synthesis to generate waveforms up to 400,000 points HAMEG HMF 2550 digital AWG under an oscilloscope displaying the generated waveform. An arbitrary waveform generator (AWG) is a piece of electronic test equipment used to generate electrical waveforms.