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  2. Jovian Infrared Auroral Mapper - Wikipedia

    en.wikipedia.org/wiki/Jovian_Infrared_Auroral_Mapper

    The primary goal of JIRAM is to probe the upper layers of Jupiter's atmosphere down to pressures of 5–7 bars (72–102 pound/square inch) at infrared wavelengths in the 2–5 μm interval using an imager and a spectrometer. [1] The Jupiter's atmosphere and auroral regions are targeted for study. [2]

  3. Jovian Auroral Distributions Experiment - Wikipedia

    en.wikipedia.org/wiki/Jovian_Auroral...

    Jovian Auroral Distributions Experiment (JADE) is an instrument that detects and measures ions and electrons around the spacecraft. [1] It is a suite of detectors on the Juno Jupiter orbiter (launched 2011, orbiting Jupiter since 2016). [ 2 ]

  4. Non-contact wafer testing - Wikipedia

    en.wikipedia.org/wiki/Non-contact_wafer_testing

    repeated probing can damage the probe pad on the IC, making further probing of that IC impossible; the probe card may be damaged from repeated contact, or become contaminated with debris created by contact with the wafer [2] the probe will act as a circuit and affect the results of the test.

  5. Scientific research on the International Space Station

    en.wikipedia.org/wiki/Scientific_research_on_the...

    Expedition 8 Commander and Science Officer Michael Foale conducts an inspection of the Microgravity Science Glovebox. ESA astronaut Thomas Reiter, STS-116 mission specialist, works with the Passive Observatories for Experimental Microbial Systems in Micro-G (POEMS) payload in the Minus Eighty Degree Laboratory Freezer for ISS (MELFI) inside the Destiny laboratory.

  6. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    The wafer prober brings an array of microscopic needles or probes called a probe card into electrical contact with the wafer (vacuum-mounted on a wafer chuck). WPT and WFT use different probe cards, the WFT card contacts a chip's bond pads. After each test the prober moves the wafer to the next testing location.

  7. Nanoprobing - Wikipedia

    en.wikipedia.org/wiki/Nanoprobing

    Navigation of the probe tips in SEM based nanoprobers are typically controlled by precision piezoelectric manipulators. Typical systems have anywhere from 2 to 8 probe manipulators with high end tools having better than 5 nm of placement resolution in the X, Y & Z axes and a high accuracy sample stage for navigation of the sample under test.

  8. Experimental testing of time dilation - Wikipedia

    en.wikipedia.org/wiki/Experimental_testing_of...

    Results of the Frisch–Smith experiment. Curves computed for M N e w t o n {\displaystyle M_{\mathrm {Newton} }} and M S R {\displaystyle M_{\mathrm {SR} }} . If no time dilation exists, then those muons should decay in the upper regions of the atmosphere, however, as a consequence of time dilation they are present in considerable amount also ...

  9. Four-terminal sensing - Wikipedia

    en.wikipedia.org/wiki/Four-terminal_sensing

    Four-point measurement of resistance between voltage sense connections 2 and 3. Current is supplied via force connections 1 and 4. In electrical engineering, four-terminal sensing (4T sensing), 4-wire sensing, or 4-point probes method is an electrical impedance measuring technique that uses separate pairs of current-carrying and voltage-sensing electrodes to make more accurate measurements ...