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Crystals used in X-ray crystallography may be smaller than a millimeter across. Although crystallography can be used to characterize the disorder in an impure or irregular crystal, crystallography generally requires a pure crystal of high regularity to solve the structure of a complicated arrangement of atoms.
When Wilhelm Röntgen discovered X-rays in 1895 [1] physicists were uncertain of the nature of X-rays, but suspected that they were waves of electromagnetic radiation.The Maxwell theory of electromagnetic radiation was well accepted, and experiments by Charles Glover Barkla showed that X-rays exhibited phenomena associated with electromagnetic waves, including transverse polarization and ...
In physics, the phase problem is the problem of loss of information concerning the phase that can occur when making a physical measurement. The name comes from the field of X-ray crystallography , where the phase problem has to be solved for the determination of a structure from diffraction data. [ 1 ]
This is an X-ray diffraction pattern formed when X-rays are focused on a crystalline material, in this case a protein. Each dot, called a reflection, forms from the coherent interference of scattered X-rays passing through the crystal.
RHEED is used to interrogate surface structure. [1] [2] Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [3] X-ray standing waves, another X-ray variant where the intensity decay into a sample from diffraction is used to analyze chemistry. [4]
X-ray absorption spectroscopy (XAS) is a widely used technique for determining the local geometric and/or electronic structure of matter. [1] The experiment is usually performed at synchrotron radiation facilities, which provide intense and tunable X-ray beams. Samples can be in the gas phase, solutions, or solids. [2]
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [1] using a laboratory diffractometer and a monochromatic X-ray pencil beam.
The fundamental physics upon which the technique is based provides high precision and accuracy in the measurement of interplanar spacings, sometimes to fractions of an Ångström, resulting in authoritative identification frequently used in patents, criminal cases and other areas of law enforcement. The ability to analyze multiphase materials ...