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A clear overlay on a map, on which notations, additional data, or copied data, can be drawn without damaging the map; Metallized boPET is used as a mirror-like decorative surface on some book covers, T-shirts, and other flexible cloths. Protective covering over buttons/pins/badges; The glossy top layer of a Polaroid SX-70 photographic print
Inspection of fibers can include Fourier transform infrared (FTIR), Raman, and attenuated total reflectance (ATR) spectroscopy, “When sampling a work of art is deemed appropriate, scientists routinely use scanning electron microscopy–energy dispersive spectroscopy (SEM-EDS), X-ray diffraction (XRD), and Fourier transform infrared ...
For IC production in the 1960s and early 1970s, an opaque rubylith film laminated onto a transparent mylar sheet was used. The design of one layer was cut into the rubylith, initially by hand on an illuminated drafting table (later by machine ()) and the unwanted rubylith was peeled off by hand, forming the master image of that layer of the chip, often called "artwork".
Fluorescent penetrant inspection (FPI) is a type of dye penetrant inspection in which a fluorescent dye is applied to the surface of a non-porous material in order to detect defects that may compromise the integrity or quality of the part in question. FPI is noted for its low cost and simple process, and is used widely in a variety of industries.
A space blanket (also known as a Mylar blanket, emergency blanket, first aid blanket, safety blanket, thermal blanket, weather blanket, heat sheet, foil blanket, or shock blanket) is an especially low-weight, low-bulk blanket made of heat-reflective thin plastic sheeting. They are used on the exterior surfaces of spacecraft for thermal control ...
Seward's model was based upon "charge transport through the Mylar-paper-platen structure" [5] and is appropriately called the 'charge transport model'. Subsequent testing [7], [8] demonstrated that the charge transport model, while not perfect, is sound. This testing also clarified that areas of indentation are less negatively charged than ...
A more serious concern was the effect of feature-to-feature positioning errors (overlay). Consequently, the self-aligned sidewall imaging approach (described below) has succeeded this approach. A "brute force" approach for patterning trenches involves a sequence of (at least) two separate exposures and etchings of independent patterns into the ...
In silicon wafer manufacturing overlay control is the control of pattern-to-pattern alignment necessary in the manufacture of silicon wafers. Silicon wafers are currently manufactured in a sequence of steps, each stage placing a pattern of material on the wafer; in this way transistors , contacts, etc., all made of different materials, are laid ...