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Free-electron lasers have been developed for use in X-ray diffraction and crystallography. [27] These are the brightest X-ray sources currently available; with the X-rays coming in femtosecond bursts. The intensity of the source is such that atomic resolution diffraction patterns can be resolved for crystals otherwise too small for collection.
The dominant physical process in x-ray absorption is one where the absorbed photon ejects a core photoelectron from the absorbing atom, leaving behind a core hole. [1] The ejected photoelectron's energy will be equal to that of the absorbed photon minus the binding energy of the initial core state.
The use of computational methods for the powder X-ray diffraction data analysis is now generalized. It typically compares the experimental data to the simulated diffractogram of a model structure, taking into account the instrumental parameters, and refines the structural or microstructural parameters of the model using least squares based ...
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.
Pole figure and diffraction figure. Consider the diffraction pattern obtained with a single crystal, on a plane that is perpendicular to the beam, e.g. X-ray diffraction with the Laue method, or electron diffraction in a transmission electron microscope. The diffraction figure shows spots. The position of the spots is determined by the Bragg's ...
Reflection high-energy electron diffraction (RHEED), where electrons of relatively high energy diffract at small angles from a surface. RHEED is used to interrogate surface structure. [1] [2] Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [3]
Small-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes and characteristic distances of partially ordered materials. [1]
Dark-field X-ray microscopy (DFXM [1] or DFXRM [2]) is an imaging technique used for multiscale structural characterisation. It is capable of mapping deeply embedded structural elements with nm-resolution using synchrotron X-ray diffraction -based imaging.