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A plugtest or plugfest is an event based on a certain technical standard where the designers of electronic equipment or software test the interoperability of their products or designs with those of other manufacturers. It could be literally plugging company A's cable into company B's socket, or a more elaborate test resembling a realistic scenario.
A receptacle tester for North American wiring. An electrical outlet tester, receptacle tester, or socket tester is a small device containing a 3-prong power plug and three indicator lights, used for quickly detecting some types of incorrectly-wired electrical wall outlets or campsite supplies.
List of free analog and digital electronic circuit simulators, available for Windows, macOS, Linux, and comparing against UC Berkeley SPICE. The following table is split into two groups based on whether it has a graphical visual interface or not.
The following table lists software packages with their own article on Wikipedia that are nominal EM (electromagnetic) simulators; Name License Windows Linux 3D
Cable tester; Capacitance meter; CDMA mobile test set; Chip-scale atomic clock; Circuit breaker analyzer; Class of accuracy in electrical measurements; Comb generator; Continuity tester; Coulombmeter; Cryogenic current comparator; Current clamp; Current transformer; Curve tracer
Dragonfly - Embedded test IP insertion tool for logic, memory and mixed-signal testing; Silicon Insight - Interactive program that works with 3rd party testers for controlling and logging of data on the device for at-speed testing; Yield Insight - Yield analysis program which looks at foundry and performance data to diagnose possible problems
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.
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