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A disadvantage of AFM compared with the scanning electron microscope (SEM) is the single scan image size. In one pass, the SEM can image an area on the order of square millimeters with a depth of field on the order of millimeters, whereas the AFM can only image a maximum scanning area of about 150×150 micrometers and a maximum height on the ...
Commercially available nanoprobing systems are integrated into either a vacuum-based scanning electron microscope (SEM) or atomic force microscope (AFM). Nanoprobing systems that are based on AFM technology are referred to as Atomic Force nanoProbers (AFP).
The technique is complementary to other surface characterization methods such as surface plasmon resonance (SPR), [8] electrochemical scanning tunneling microscopy (ESTM), [9] and atomic force microscopy (AFM) [10] in the interrogation of various interfacial phenomena.
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.
Some LVEMs can function as an SEM, a TEM, and a STEM in a single compact instrument. Using a low beam voltage increases image contrast which is especially important for biological specimens. This increase in contrast significantly reduces, or even eliminates the need to stain biological samples.
Atomic force microscope inside a FTIR spectrometer with the optical interface The earliest measurements combining AFM with infrared spectroscopy were performed in 1999 by Hammiche et al . at the University of Lancaster in the United Kingdom, [ 1 ] in an EPSRC -funded project led by M Reading and H M Pollock.
Figure 1: Photograph of an AFM system which can be used for chemical force microscopy. In materials science, chemical force microscopy (CFM) is a variation of atomic force microscopy (AFM) which has become a versatile tool for characterization of materials surfaces.
Schematic and SEM images of a conventional SThM tip based on an Au–Cr thermocouple. [1] SThM using the N-V center in diamond. (a) Schematics of experimental setup. An electric current is applied to the arms of an AFM cantilever (phosphorus-doped Si, P:Si) and heats up the end section above the tip (intrinsic Si, i-Si).