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  2. Overlay control - Wikipedia

    en.wikipedia.org/wiki/Overlay_Control

    In silicon wafer manufacturing overlay control is the control of pattern-to-pattern alignment necessary in the manufacture of silicon wafers. Silicon wafers are currently manufactured in a sequence of steps, each stage placing a pattern of material on the wafer; in this way transistors , contacts, etc., all made of different materials, are laid ...

  3. List of electronic component packaging types - Wikipedia

    en.wikipedia.org/wiki/List_of_electronic...

    The codes given in the chart below usually tell the length and width of the components in tenths of millimeters or hundredths of inches. For example, a metric 2520 component is 2.5 mm by 2.0 mm which corresponds roughly to 0.10 inches by 0.08 inches (hence, imperial size is 1008).

  4. Geographic information system - Wikipedia

    en.wikipedia.org/wiki/Geographic_Information_System

    CGIS was an improvement over "computer mapping" applications as it provided capabilities for data storage, overlay, measurement, and digitizing/scanning. It supported a national coordinate system that spanned the continent, coded lines as arcs having a true embedded topology and it stored the attribute and locational information in separate files.

  5. Rudolph Enters Back-End Lithography Market with Breakthrough ...

    www.aol.com/news/2012-12-12-rudolph-enters-back...

    Rudolph's total lithography system includes the JetStep 2X reduction stepper integrated with Rudolph's equipment automation and fault detectionsoftware; the Company's flagship NSX ® inspection ...

  6. Geodetic control network - Wikipedia

    en.wikipedia.org/wiki/Geodetic_control_network

    Electronic distance measurement (EDM) was introduced around 1960, when the prototype instruments became small enough to be used in the field. Instead of using only sparse and much less accurate distance measurements some control networks were established or updated by using trilateration more accurate distance measurements than was previously possible and no angle measurements.

  7. Vector overlay - Wikipedia

    en.wikipedia.org/wiki/Vector_overlay

    Vector overlay is an operation (or class of operations) in a geographic information system (GIS) for integrating two or more vector spatial data sets. Terms such as polygon overlay , map overlay , and topological overlay are often used synonymously, although they are not identical in the range of operations they include.

  8. Obesity dipped in U.S. adults last year for the first time in ...

    www.aol.com/obesity-dipped-u-adults-last...

    The study looked at body mass index measurements of more than 16.7 million adults across different geographic regions, age groups, sexes, races and ethnicities from 2013 through 2023. BMI ...

  9. Hero officers and good Samaritans who went above and beyond ...

    www.aol.com/news/hero-officers-good-samaritans...

    Here are some examples of law enforcement officers and good Samaritans taking heroic action over the past year. Last January, a police officer in Jonesboro, ...