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  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  3. Structural equation modeling - Wikipedia

    en.wikipedia.org/wiki/Structural_equation_modeling

    Structural equation modeling (SEM) is a diverse set of methods used by scientists for both observational and experimental research. SEM is used mostly in the social and behavioral science fields, but it is also used in epidemiology, [2] business, [3] and other fields. A common definition of SEM is, "...a class of methodologies that seeks to ...

  4. Partial least squares path modeling - Wikipedia

    en.wikipedia.org/wiki/Partial_least_squares_path...

    The partial least squares path modeling or partial least squares structural equation modeling (PLS-PM, PLS-SEM) [1] [2] [3] is a method for structural equation modeling that allows estimation of complex cause-effect relationships in path models with latent variables.

  5. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    The first STEM was built in 1938 by Baron Manfred von Ardenne, [2] [3] working in Berlin for Siemens.However, at the time the results were inferior to those of transmission electron microscopy, and von Ardenne only spent two years working on the problem.

  6. Electron channelling contrast imaging - Wikipedia

    en.wikipedia.org/wiki/Electron_channelling...

    Electron channelling contrast imaging (ECCI) is a scanning electron microscope (SEM) diffraction technique used in the study of defects in materials. These can be dislocations or stacking faults that are close to the surface of the sample, low angle grain boundaries or atomic steps.

  7. Standard error - Wikipedia

    en.wikipedia.org/wiki/Standard_error

    This page was last edited on 13 October 2024, at 13:49 (UTC).; Text is available under the Creative Commons Attribution-ShareAlike 4.0 License; additional terms may apply.

  8. Annular dark-field imaging - Wikipedia

    en.wikipedia.org/wiki/Annular_dark-field_imaging

    High-angle annular dark-field imaging (HAADF) is a STEM technique which produces an annular dark field image formed by very high angle, incoherently scattered electrons (Rutherford scattered from the nucleus of the atoms) — as opposed to Bragg scattered electrons.

  9. High-resolution transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/High-resolution...

    High-resolution image of magnesium sample.. High-resolution transmission electron microscopy is an imaging mode of specialized transmission electron microscopes that allows for direct imaging of the atomic structure of samples.