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  2. Hardware stress test - Wikipedia

    en.wikipedia.org/wiki/Hardware_stress_test

    Stress testing, in general, should put computer hardware under exaggerated levels of stress in order to ensure stability when used in a normal environment. These can include extremes of workload, type of task, memory use, thermal load (heat), clock speed, or voltages. Memory and CPU are two components that are commonly stress tested in this way.

  3. Stress testing (computing) - Wikipedia

    en.wikipedia.org/wiki/Stress_testing_(computing)

    A stress test (sometimes called a torture test) of hardware is a form of deliberately intense and thorough testing used to determine the stability of a given system or entity. It involves testing beyond normal operational capacity , often to a breaking point, in order to observe the results.

  4. Power supply unit (computer) - Wikipedia

    en.wikipedia.org/wiki/Power_supply_unit_(computer)

    For example, a 900-watt power supply with the 80 Plus Silver efficiency rating (which means that such a power supply is designed to be at least 85% efficient for loads above 180 W) may only be 73% efficient when the load is lower than 100 W, which is a typical idle power for a desktop computer. Thus, for a 100 W load, losses for this supply ...

  5. Stress testing - Wikipedia

    en.wikipedia.org/wiki/Stress_testing

    The goal and objectives, the time frame, the stress test level and the total costs of the stress test are defined. Phase 2: Assessment, during which the stress test at the component and the system scope is performed, including fragility [12] and risk [13] analysis of the CIs for the stressors defined in Phase 1. The stress test can result in ...

  6. Power Management Bus - Wikipedia

    en.wikipedia.org/wiki/Power_Management_Bus

    Some devices may expose such attributes in multiple "pages", as for example one page managing each power supply rail (maybe 3.3V, 5V, 12V, −12V, and a programmable supply supporting 1.0–1.8V). The device may set warning and fault limits, where crossing a limit will alert the host and possibly trigger fault recovery.

  7. Prime95 - Wikipedia

    en.wikipedia.org/wiki/Prime95

    Prime95 28.7 running a stress test on an Intel quad-core Windows 10 system. To maximize search throughput, most of Prime95 is written in hand-tuned assembly, which makes its system resource usage much greater than most other computer programs. Additionally, due to the high precision requirements of primality testing, the program is very ...

  8. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    These can manifest only at specific environmental conditions, high clock speeds, low power supply voltages, and sometimes specific circuit signal states; significant variations can occur on a single die. [9] Overstress-induced damage like ohmic shunts or a reduced transistor output current can increase such delays, leading to erratic behavior.

  9. Power good signal - Wikipedia

    en.wikipedia.org/wiki/Power_good_signal

    The ATX specification defines the Power-Good signal as a +5-volt (V) signal generated in the power supply when it has passed its internal self-tests and the outputs have stabilized. This normally takes between 0.1 and 0.5 seconds after the power supply is switched on.

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