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The Indian-head test pattern is a test card that gained widespread adoption during the black-and-white television broadcasting era as an aid in the calibration of television equipment. It features a drawing of a Native American wearing a headdress surrounded by numerous graphic elements designed to test different aspects of broadcast display.
(1) Qualifying to take JEE-Advanced does not mean IIT admission. [25] [26] (2) Reserved categories have lower qualifying cutoff, (e.g. GEN-EWS/OBC-NCL get 10% relaxation, SC/ST/PWD get 50% relaxation and SC/ST/PWD also get 75% relaxation for preparatory courses in IITs) who are also considered qualified and thus included in the list. [27]
The JAC, formerly known as Jharkhand Intermediate Council (JIC), first came into consideration on 15 November 2000 after the state was formed by the Government of India. Three years after Jharkhand was formed, the state legislature enacted Jharkhand Academic Council Act 2003 to constitute a state government agency and hence, the Jharkhand ...
The Joint Admission Test for Masters (JAM) is a common admission test conducted every year for admission into Master of Science (M.Sc.) and other post-graduate science programs at Indian Institutes of Technology (IITs), Indian Institute of Science (IISc), Indian Institutes of Information Technology (IIITs) and National Institutes of Technology (NITs), organized by alternating institutes every ...
The AIEEE was introduced in 2002, since the newly established NITs, IIITs and GFTIs wanted an entrance examination paper of a higher standard than the Common Engineering Test (CET), which was formerly used for admission to all non-IIT engineering colleges and some state government colleges also in few states, including even RECs and IIITs, owing mostly to the rising competition and the goal of ...
Each incorrect answer leads to the deduction of 1 mark. Unanswered questions are awarded 0 mark. Therefore, maximum marks awarded in IAT are 240. The total marks obtained by a candidate out of 240 is considered for preparing the Rank List. Not every candidate appearing in IAT is awarded a rank. Rank cut-off is announced at an appropriate time.
Snell & Wilcox SW2 and SW4 "Zone Plate" Test Chart (also referred to as Snell & Wilcox Test Pattern) were TV test cards introduced in the 1990s and used with NTSC, PAL and SDTV systems. [1] Popular versions of the test charts were made available on Laserdisc and DVD-Video, allowing home users and professionals to test and calibrate their equipment.
A 1951 USAF resolution test chart is a microscopic optical resolution test device originally defined by the U.S. Air Force MIL-STD-150A standard of 1951. The design provides numerous small target shapes exhibiting a stepped assortment of precise spatial frequency specimens.