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The Nelson rules were first published in the October 1984 issue of the Journal of Quality Technology in an article by Lloyd S Nelson. [2] The rules are applied to a control chart on which the magnitude of some variable is plotted against time. The rules are based on the mean value and the standard deviation of the samples.
Control charts are graphical plots used in production control to determine whether quality and manufacturing processes are being controlled under stable conditions. (ISO 7870-1) [1] The hourly status is arranged on the graph, and the occurrence of abnormalities is judged based on the presence of data that differs from the conventional trend or deviates from the control limit line.
In statistical process control (SPC), the ¯ and R chart is a type of scheme, popularly known as control chart, used to monitor the mean and range of a normally distributed variables simultaneously, when samples are collected at regular intervals from a business or industrial process. [1]
The resulting plots are analyzed as for other control charts, using the rules that are deemed appropriate for the process and the desired level of control. At the least, any points above either upper control limits or below the lower control limit are marked and considered a signal of changes in the underlying process that are worth further ...
Image file depicting control chart for the mean meancenter: No: None: None: How to compute the mean control chart center line meanlimits: No: None: None: How to compute the mean control chart limits (if limits are symmetric) meanupperlimit: No: None!{{meanlimits}} How to compute the mean control chart upper limit (if limits are asymmetric ...
The Western Electric rules are decision rules in statistical process control for detecting out-of-control or non-random conditions on control charts. [1] Locations of the observations relative to the control chart control limits (typically at ±3 standard deviations) and centerline indicate whether the process in question should be investigated for assignable causes.
This control chart was created with Inkscape. This file uses embedded text. The file size of this SVG image may be irrationally large because its text has been converted to paths inhibiting translations.
Simple example of a process control chart, tracking the etch (removal) rate of Silicon in an ICP Plasma Etcher at a microelectronics waferfab. [1] Time-series data shows the mean value and ±5% bars. A more sophisticated SPC chart may include "control limit" & "spec limit" % lines to indicate whether/what action should be taken.