enow.com Web Search

  1. Ads

    related to: scanning electron microscopy instrumentation

Search results

  1. Results from the WOW.Com Content Network
  2. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  3. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...

  4. Detectors for transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Detectors_for_transmission...

    Charge coupled device (CCD) cameras were first applied to transmission electron microscopy in the 1980s and later became widespread. [3] [4] For use in a TEM, CCDs are typically coupled with a scintillator such as single crystal Yttrium aluminium garnet (YAG) in which electrons from the electron beam are converted to photons, which are then transferred to the sensor of the CCD via a fiber ...

  5. Annular dark-field imaging - Wikipedia

    en.wikipedia.org/wiki/Annular_dark-field_imaging

    Annular dark-field imaging is a method of mapping samples in a scanning transmission electron microscope (STEM). These images are formed by collecting scattered electrons with an annular dark-field detector. [1] Conventional TEM dark-field imaging uses an objective aperture to only collect scattered electrons that pass through.

  6. Everhart–Thornley detector - Wikipedia

    en.wikipedia.org/wiki/Everhart–Thornley_detector

    The E-T secondary electron detector can be used in the SEM's back-scattered electron mode by either turning off the Faraday cage or by applying a negative voltage to the Faraday cage. However, better back-scattered electron images come from dedicated BSE detectors rather than from using the E–T detector as a BSE detector.

  7. Environmental scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Environmental_scanning...

    The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber.

  1. Ads

    related to: scanning electron microscopy instrumentation