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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
The angle of incidence, in geometric optics, is the angle between a ray incident on a surface and the line perpendicular (at 90 degree angle) to the surface at the point of incidence, called the normal. The ray can be formed by any waves, such as optical, acoustic, microwave, and X-ray. In the figure below, the line representing a ray makes an ...
X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
X-ray mirrors can be built, but only if the angle from the plane of reflection is very low (typically 10 arc-minutes to 2 degrees). [2] These are called glancing (or grazing ) incidence mirrors . In 1952, Hans Wolter outlined three ways a telescope could be built using only this kind of mirror.
Reflection high-energy electron diffraction (RHEED), where electrons of relatively high energy diffract at small angles from a surface. RHEED is used to interrogate surface structure. [1] [2] Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [3]
Diagram showing vectors used to define the BRDF. All vectors are unit length. points toward the light source. points toward the viewer (camera). is the surface normal.. The bidirectional reflectance distribution function (BRDF), symbol (,), is a function of four real variables that defines how light from a source is reflected off an opaque surface. It is employed in the optics of real-world ...
Spectrometers may operate over a wide range of non-optical wavelengths, from gamma rays and X-rays into the far infrared. If the instrument is designed to measure the spectrum on an absolute scale rather than a relative one, then it is typically called a spectrophotometer. The majority of spectrophotometers are used in spectral regions near the ...