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Thickness of the Ge 40 Se 60 /Si film on the silicon substrate as 34.5 nm, Thickness of the Ge 40 Se 60 /Si film on the oxidized silicon substrate as 33.6 nm, Thickness of SiO 2 (with n and k spectra of SiO 2 held fixed), and; n and k spectra, in 190–1000 nm range, of Ge 40 Se 60 /Si.
The effects of thin-film interference can also be seen in oil slicks and soap bubbles. The reflectance spectrum of a thin-film features distinct oscillations and the extrema of the spectrum can be used to calculate the thickness of the thin-film. [1] Ellipsometry is a technique that is often used to measure properties of thin films. In a ...
The basic form of a 2-dimensional thin film equation is [3] [4] [5] = where the fluid flux is = [(+ ^) + ^] +, and μ is the viscosity (or dynamic viscosity) of the liquid, h(x,y,t) is film thickness, γ is the interfacial tension between the liquid and the gas phase above it, is the liquid density and the surface shear.
Although the scattering length density profile is normally a continuously varying function, the interfacial structure can often be well approximated by a slab model in which layers of thickness (d n), scattering length density (ρ n) and roughness (σ n,n+1) are sandwiched between the super- and sub-phases. One then uses a refinement procedure ...
A thin film is a layer of materials ranging from fractions of a nanometer to several micrometers in thickness. [1] The controlled synthesis of materials as thin films (a process referred to as deposition) is a fundamental step in many applications.
The calculation of glass properties allows "fine-tuning" of desired material characteristics, e.g., the refractive index. [1]The calculation of glass properties (glass modeling) is used to predict glass properties of interest or glass behavior under certain conditions (e.g., during production) without experimental investigation, based on past data and experience, with the intention to save ...
Compared to traditional porosimeters, Ellipsometer porosimeters are well suited to very thin film pore size and pore size distribution measurement. Film porosity is a key factor in silicon based technology using low-κ materials, organic industry (encapsulated organic light-emitting diodes) as well as in the coating industry using sol gel ...
Thin-film optics is the branch of optics that deals with very thin structured layers of different materials. [1] In order to exhibit thin-film optics, the thickness of the layers of material must be similar to the coherence length ; for visible light it is most often observed between 200 and 1000 nm of thickness.