enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. Stuck-at fault - Wikipedia

    en.wikipedia.org/wiki/Stuck-at_fault

    The test vector is a collection of bits to apply to the circuit's inputs, and a collection of bits expected at the circuit's output. If the gate pin under consideration is grounded, and this test vector is applied to the circuit, at least one of the output bits will not agree with the corresponding output bit in the test vector.

  3. Failure detector - Wikipedia

    en.wikipedia.org/wiki/Failure_detector

    In a distributed computing system, a failure detector is a computer application or a subsystem that is responsible for the detection of node failures or crashes. [1] Failure detectors were first introduced in 1996 by Chandra and Toueg in their book Unreliable Failure Detectors for Reliable Distributed Systems.

  4. Network analysis (electrical circuits) - Wikipedia

    en.wikipedia.org/wiki/Network_analysis...

    [2]: 2-8 - 2-9 For all nodes, except a chosen reference node, the node voltage is defined as the voltage drop from the node to the reference node. Therefore, there are N-1 node voltages for a circuit with N nodes. [2]: 2-10 In principle, nodal analysis uses Kirchhoff's current law (KCL) at N-1 nodes to get N-1 independent equations. Since ...

  5. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  6. Modified nodal analysis - Wikipedia

    en.wikipedia.org/wiki/Modified_nodal_analysis

    In electrical engineering, modified nodal analysis [1] or MNA is an extension of nodal analysis which not only determines the circuit's node voltages (as in classical nodal analysis), but also some branch currents. Modified nodal analysis was developed as a formalism to mitigate the difficulty of representing voltage-defined components in nodal ...

  7. Cyclic redundancy check - Wikipedia

    en.wikipedia.org/wiki/Cyclic_redundancy_check

    The polynomial is written in binary as the coefficients; a 3rd-degree polynomial has 4 coefficients (1x 3 + 0x 2 + 1x + 1). In this case, the coefficients are 1, 0, 1 and 1. The result of the calculation is 3 bits long, which is why it is called a 3-bit CRC. However, you need 4 bits to explicitly state the polynomial. Start with the message to ...

  8. Nodal analysis - Wikipedia

    en.wikipedia.org/wiki/Nodal_analysis

    In practice, the voltage at the reference node is taken to be 0. Consider it is the last node, v N = 0 {\displaystyle v_{N}=0} . In this case, it is straightforward to verify that the resulting equations for the other N − 1 {\displaystyle N-1} nodes remain the same, and therefore one can simply discard the last column as well as the last line ...

  9. Low-density parity-check code - Wikipedia

    en.wikipedia.org/wiki/Low-density_parity-check_code

    The parity bit may be used within another constituent code. In an example using the DVB-S2 rate 2/3 code the encoded block size is 64800 symbols (N=64800) with 43200 data bits (K=43200) and 21600 parity bits (M=21600). Each constituent code (check node) encodes 16 data bits except for the first parity bit which encodes 8 data bits.

  1. Related searches vs code not detecting node in circuit generator 2 8 4 0 review

    vs code not detecting node in circuit generator 2 8 4 0 review and complaints