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  2. Ladder logic - Wikipedia

    en.wikipedia.org/wiki/Ladder_logic

    Ladder notation is best suited to control problems where only binary variables are required and where interlocking and sequencing of binary is the primary control problem. Like all parallel programming languages , the sequential order of operations may be undefined or obscure; logic race conditions are possible which may produce unexpected results.

  3. Carry-lookahead adder - Wikipedia

    en.wikipedia.org/wiki/Carry-lookahead_adder

    The XOR is used normally within a basic full adder circuit; the OR is an alternative option (for a carry-lookahead only), which is far simpler in transistor-count terms. For the example provided, the logic for the generate and propagate values are given below. The numeric value determines the signal from the circuit above, starting from 0 on ...

  4. DSV Limiting Factor - Wikipedia

    en.wikipedia.org/wiki/DSV_Limiting_Factor

    Speed = 1 to 2 kn (1.7 to 3.4 ft/s; 0.5 to 1.0 m/s) vertical, 2 to 3 kn (3.4 to 5.1 ft/s; 1.0 to 1.5 m/s) lateral [2] Hull form configuration has been optimized for vertical travel, as much of the traveling time will be spent ascending and descending through the water column [ 2 ]

  5. Flying probe - Wikipedia

    en.wikipedia.org/wiki/Flying_probe

    One limitation in flying probe test methods is the speed at which measurements can be taken; the probes must be moved to each new test site on the board, and then a measurement must be completed. Bed-of-nails testers touch each test point simultaneously and electronic switching of instruments between test pins is more rapid than movement of probes.

  6. Flash ADC - Wikipedia

    en.wikipedia.org/wiki/Flash_ADC

    Flash converters are high-speed compared to many other ADCs, which usually narrow in on the correct answer over a series of stages. Compared to these, a flash converter is also quite simple and, apart from the analog comparators, only requires logic for the final conversion to binary .

  7. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    In-Circuit Test (ICT) is a widely used and cost-efficient [2] method for testing medium- to high-volume electronic printed circuit board assemblies (PCBAs). It has maintained its popularity over the years due to its ability to diagnose component-level faults and its operational speed. Using In-Circuit Test fixtures is a very effective way of ...

  8. Emitter-coupled logic - Wikipedia

    en.wikipedia.org/wiki/Emitter-coupled_logic

    In electronics, emitter-coupled logic (ECL) is a high-speed integrated circuit bipolar transistor logic family. ECL uses an overdriven bipolar junction transistor (BJT) differential amplifier with single-ended input and limited emitter current to avoid the saturated (fully on) region of operation and the resulting slow turn-off behavior. [ 2 ]

  9. Analog delay line - Wikipedia

    en.wikipedia.org/wiki/Analog_delay_line

    A magnetostrictive torsion wire delay line Schematic of circuit connections to the acoustic delay line used in NBS mercury memory (top); block diagram of the mercury memory system (bottom) FUJIC's ultrasonic mercury delay line memory (capacity: 255 words = 8,415 bits) Ultrasonic delay line from a PAL color TV (delay time 64 μs), showing path ...