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The Joint Admission Test for Masters (JAM) is a common admission test conducted every year for admission into Master of Science (M.Sc.) and other post-graduate science programs at Indian Institutes of Technology (IITs), Indian Institute of Science (IISc), Indian Institutes of Information Technology (IIITs) and National Institutes of Technology (NITs), organized by alternating institutes every ...
The Joint Entrance Examination – Advanced (JEE-Advanced) (formerly the Indian Institute of Technology – Joint Entrance Examination (IIT-JEE)) is an academic examination held annually in India that tests the skills and knowledge of the applicants in physics, chemistry and mathematics.
The JAC, formerly known as Jharkhand Intermediate Council (JIC), first came into consideration on 15 November 2000 after the state was formed by the Government of India. Three years after Jharkhand was formed, the state legislature enacted Jharkhand Academic Council Act 2003 to constitute a state government agency and hence, the Jharkhand ...
IISER Aptitude Test (IAT) is an Indian computer-based test for admission to the various undergraduate programs offered by the seven IISERs, along with IISc Bangalore and IIT Madras.
The AIEEE was introduced in 2002, since the newly established NITs, IIITs and GFTIs wanted an entrance examination paper of a higher standard than the Common Engineering Test (CET), which was formerly used for admission to all non-IIT engineering colleges and some state government colleges also in few states, including even RECs and IIITs, owing mostly to the rising competition and the goal of ...
The admission towards a full-time Bachelor of Technology degree in DTU is through the Joint Admission Counselling Delhi (JAC-Delhi) [18] process, based on All India Rank (AIR) secured in the Joint Entrance Examination – Main examination. Admission of foreign students to DTU is through the Direct Admission of Students Abroad (DASA) scheme. [19]
The Indian-head test pattern is a test card that gained widespread adoption during the black-and-white television broadcasting era as an aid in the calibration of television equipment. It features a drawing of a Native American wearing a headdress surrounded by numerous graphic elements designed to test different aspects of broadcast display.
Snell & Wilcox SW2 and SW4 "Zone Plate" Test Chart (also referred to as Snell & Wilcox Test Pattern) were TV test cards introduced in the 1990s and used with NTSC, PAL and SDTV systems. [1] Popular versions of the test charts were made available on Laserdisc and DVD-Video, allowing home users and professionals to test and calibrate their equipment.