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2. Test probe - Wikipedia

   en.wikipedia.org/wiki/Test_probe

   Typical passive oscilloscope probe being used to test an integrated circuit. A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile.

3. In-circuit testing - Wikipedia

   en.wikipedia.org/wiki/In-circuit_testing

   A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.

4. Logic probe - Wikipedia

   en.wikipedia.org/wiki/Logic_probe

   Elenco LP-560 logic probe. It has a red LED for high state, green LED for low state, amber LED for pulsing state, and a changing audible tone. [1] A logic probe is a low-cost hand-held test probe used for analyzing and troubleshooting the logical states (boolean 0 or 1) of a digital circuit.

5. Automatic test equipment - Wikipedia

   en.wikipedia.org/wiki/Automatic_test_equipment

   An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.

6. Electronic test equipment - Wikipedia

   en.wikipedia.org/wiki/Electronic_test_equipment

   The following are used for stimulus of the circuit under test: Power supplies; Signal generator; Digital pattern generator; Pulse generator; Voltcraft M-3850 portable multimeter. The following analyze the response of the circuit under test: Oscilloscope (Displays voltage as it changes over time) Frequency counter (Measures frequency)

7. Non-contact wafer testing - Wikipedia

   en.wikipedia.org/wiki/Non-contact_wafer_testing

   the probe will act as a circuit and affect the results of the test. For this reason, the tests performed at wafer sort cannot always be identical and as extensive as those performed at the final device test after packaging is complete [3] since the probe pads are typically on the perimeter of the IC, the IC can soon become pad-limited.