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  2. List of MediaTek systems on chips - Wikipedia

    en.wikipedia.org/wiki/List_of_MediaTek_systems...

    MediaTek; General information; Launched: 2003; 22 years ago (): Designed by: MediaTek: Architecture and classification; Application: Mobile SoC: Microarchitecture ...

  3. MediaTek - Wikipedia

    en.wikipedia.org/wiki/MediaTek

    A Mediatek MT6575A inside an LG E455 Android smartphone. MediaTek Inc. (Chinese: 聯發科技股份有限公司; pinyin: Liánfā Kējì Gǔfèn Yǒuxiàn Gōngsī), sometimes informally abbreviated as MTK, is a Taiwanese fabless semiconductor company that designs and manufactures a range of semiconductor products, providing chips for wireless communications, high-definition television ...

  4. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.

  5. Qualcomm EDL mode - Wikipedia

    en.wikipedia.org/wiki/Qualcomm_EDL_mode

    Screenshot of Device Manager, containing a Qualcomm device booted in the Emergency Download Mode. The Qualcomm Emergency Download mode, commonly known as Qualcomm EDL mode and officially known as Qualcomm HS-USB QD-Loader 9008 [1] is a feature implemented in the boot ROM of a system on a chip by Qualcomm which can be used to recover bricked smartphones.

  6. ARM Cortex-A53 - Wikipedia

    en.wikipedia.org/wiki/ARM_Cortex-A53

    The Cortex-A53 is the most widely used platform for mobile SoCs since 2014 to the present day [as of?], making it one of the longest-running ARM platform for mobile devices.

  7. Wafer testing - Wikipedia

    en.wikipedia.org/wiki/Wafer_testing

    Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.

  8. List of 3D-enabled mobile phones - Wikipedia

    en.wikipedia.org/wiki/List_of_3D-enabled_mobile...

    This is a list of 3D-enabled mobile phones, which typically use autostereoscopic displays. Some devices may use other kinds of display technology, like holographic displays or multiscopic displays.

  9. TEST (x86 instruction) - Wikipedia

    en.wikipedia.org/wiki/TEST_(x86_instruction)

    In the x86 assembly language, the TEST instruction performs a bitwise AND on two operands. The flags SF, ZF, PF are modified while the result of the AND is discarded. The OF and CF flags are set to 0, while AF flag is undefined. There are 9 different opcodes for the TEST instruction depending on the type and size of the operands. It can compare ...