enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. Stuck-at fault - Wikipedia

    en.wikipedia.org/wiki/Stuck-at_fault

    The test vector is a collection of bits to apply to the circuit's inputs, and a collection of bits expected at the circuit's output. If the gate pin under consideration is grounded, and this test vector is applied to the circuit, at least one of the output bits will not agree with the corresponding output bit in the test vector.

  3. Hamming code - Wikipedia

    en.wikipedia.org/wiki/Hamming_code

    This triple repetition code is a Hamming code with m = 2, since there are two parity bits, and 2 22 − 1 = 1 data bit. Such codes cannot correctly repair all errors, however. In our example, if the channel flips two bits and the receiver gets 001, the system will detect the error, but conclude that the original bit is 0, which is incorrect.

  4. Burst error-correcting code - Wikipedia

    en.wikipedia.org/wiki/Burst_error-correcting_code

    Proof. First we observe that a code can correct all bursts of length if and only if no two codewords differ by the sum of two bursts of length . Suppose that two codewords and differ by bursts and of length each.

  5. Cyclic redundancy check - Wikipedia

    en.wikipedia.org/wiki/Cyclic_redundancy_check

    The advantage of choosing a primitive polynomial as the generator for a CRC code is that the resulting code has maximal total block length in the sense that all 1-bit errors within that block length have different remainders (also called syndromes) and therefore, since the remainder is a linear function of the block, the code can detect all 2 ...

  6. Current-mode logic - Wikipedia

    en.wikipedia.org/wiki/Current-mode_logic

    Current mode logic (CML), or source-coupled logic (SCL), is a digital design style used both for logic gates and for board-level digital signaling of digital data.. The basic principle of CML is that current from a constant current generator is steered between two alternate paths depending on whether a logic zero or logic one is being represented.

  7. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  8. Low-density parity-check code - Wikipedia

    en.wikipedia.org/wiki/Low-density_parity-check_code

    The parity bit may be used within another constituent code. In an example using the DVB-S2 rate 2/3 code the encoded block size is 64800 symbols (N=64800) with 43200 data bits (K=43200) and 21600 parity bits (M=21600). Each constituent code (check node) encodes 16 data bits except for the first parity bit which encodes 8 data bits.

  9. Failure detector - Wikipedia

    en.wikipedia.org/wiki/Failure_detector

    In a distributed computing system, a failure detector is a computer application or a subsystem that is responsible for the detection of node failures or crashes. [1] Failure detectors were first introduced in 1996 by Chandra and Toueg in their book Unreliable Failure Detectors for Reliable Distributed Systems.