enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. Energy-dispersive X-ray spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Energy-dispersive_X-ray...

    One peak is from the L shell of iron. Energy-dispersive X-ray spectroscopy ( EDS , EDX , EDXS or XEDS ), sometimes called energy dispersive X-ray analysis ( EDXA or EDAX ) or energy dispersive X-ray microanalysis ( EDXMA ), is an analytical technique used for the elemental analysis or chemical characterization of a sample .

  3. International Centre for Diffraction Data - Wikipedia

    en.wikipedia.org/wiki/International_Centre_for...

    It also publishes the journals Advances in X-ray Analysis and Powder Diffraction. In 2019, Materials Data, also known as MDI, merged with ICDD. Materials Data creates JADE software used to collect, analyze, and simulate XRD data and solve issues in an array of materials science projects.

  4. Metallography - Wikipedia

    en.wikipedia.org/wiki/Metallography

    Characterization of microstructures has also been performed using x-ray diffraction (XRD) techniques for many years. XRD can be used to determine the percentages of various phases present in a specimen if they have different crystal structures. For example, the amount of retained austenite in a hardened steel is best measured using XRD (ASTM E ...

  5. X-ray fluorescence - Wikipedia

    en.wikipedia.org/wiki/X-ray_fluorescence

    X-ray diffraction (XRD) is still the most used method for structural analysis of chemical compounds. Yet, with increasing detail on the relation of K β {\displaystyle K_{\beta }} -line spectra and the surrounding chemical environment of the ionized metal atom, measurements of the so-called valence-to-core (V2C) energy region become ...

  6. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions.

  7. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.

  8. Characteristic X-ray - Wikipedia

    en.wikipedia.org/wiki/Characteristic_X-ray

    An example of K-alpha lines is Fe K-alpha emitted as iron atoms are spiraling into a black hole at the center of a galaxy. [8] The K-alpha line in copper is frequently used as the primary source of X-ray radiation in lab-based X-ray diffraction spectrometry (XRD) instruments.

  9. Hexaferrum - Wikipedia

    en.wikipedia.org/wiki/Hexaferrum

    Hexaferrum and epsilon iron (ε-Fe) are synonyms for the hexagonal close-packed (HCP) phase of iron that is stable only at extremely high pressure. A 1964 study at the University of Rochester mixed 99.8% pure α-iron powder with sodium chloride , and pressed a 0.5-mm diameter pellet between the flat faces of two diamond anvils.