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X-ray diffraction topography is one variant of X-ray imaging, making use of diffraction contrast rather than absorption contrast which is usually used in radiography and computed tomography (CT). Topography is exploited to a lesser extent with neutrons , and is the same concept as dark field imaging in an electron microscope .
The scientists involved in developing 3DXRD contributed to the development of three other three-dimensional non-destructive techniques for the material sciences, respectively using electrons and neutrons as a probe: three-dimensional orientation mapping in the transmission electron microscope (3D-OMiTEM), [12] time-of-flight 3D neutron ...
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
This is an X-ray diffraction pattern formed when X-rays are focused on a crystalline material, in this case a protein. Each dot, called a reflection, forms from the coherent interference of scattered X-rays passing through the crystal.
It is an X-ray-diffraction [2] method and commonly used to determine a range of information about crystalline materials. The term WAXS is commonly used in polymer sciences to differentiate it from SAXS but many scientists doing "WAXS" would describe the measurements as Bragg/X-ray/powder diffraction or crystallography .
Small-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes and characteristic distances of partially ordered materials. [1]
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .
Energy-dispersive X-ray diffraction (EDXRD) is an analytical technique for characterizing materials. It differs from conventional X-ray diffraction by using polychromatic photons as the source and is usually operated at a fixed angle. [1] With no need for a goniometer, EDXRD is able to collect full diffraction patterns very quickly.