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  2. Reliability (semiconductor) - Wikipedia

    en.wikipedia.org/wiki/Reliability_(semiconductor)

    Reliability of a semiconductor device is the ability of the device to perform its intended function during the life of the device in the field. There are multiple considerations that need to be accounted for when developing reliable semiconductor devices:

  3. Sherlock Automated Design Analysis - Wikipedia

    en.wikipedia.org/wiki/Sherlock_Automated_Design...

    A reliability score – benchmarks the risk of the design compared to industry best practices; Predicted performance over time – allows product teams to project the product performance over its lifecycle; A physical map of reliability issues –identifies the likely points of failure; A histogram – groups parts by degree of risk

  4. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    In semiconductor devices, problems in the device package may cause failures due to contamination, mechanical stress of the device, or open or short circuits. Failures most commonly occur near the beginning and near the ending of the lifetime of the parts, resulting in the bathtub curve graph of failure rates.

  5. Semiconductor supply chain problems are ‘going to take a long ...

    www.aol.com/finance/semiconductor-supply-chain...

    While the short-term problems will ease, the permanent solution is to “make more semiconductors in America,” Raimondo said. In 1990, the U.S. controlled nearly 40% of the world’s ...

  6. Negative-bias temperature instability - Wikipedia

    en.wikipedia.org/wiki/Negative-bias_temperature...

    More specifically, over time positive charges become trapped at the oxide-semiconductor boundary underneath the gate of a MOSFET. These positive charges partially cancel the negative gate voltage without contributing to conduction through the channel as electron holes in the semiconductor are supposed to. When the gate voltage is removed, the ...

  7. Transistor aging - Wikipedia

    en.wikipedia.org/wiki/Transistor_aging

    Transistor aging (sometimes called silicon aging) is the process of silicon transistors developing flaws over time as they are used, degrading performance and reliability, and eventually failing altogether. Despite the name, similar mechanisms may affect transistors made of any kind of semiconductor.

  8. High-temperature operating life - Wikipedia

    en.wikipedia.org/wiki/High-temperature_operating...

    High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested at intermediate intervals.

  9. KLA (KLAC) Q2 2025 Earnings Call Transcript - AOL

    www.aol.com/kla-klac-q2-2025-earnings-041511743.html

    Foundry/logic revenue from semiconductor customers is forecasted to be approximately 73%, and memory is expected to be approximately 27% of semi-process control systems revenue to semiconductor ...