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Fugacity and BCF relate to each other in the following equation: = [6] where Z Fish is equal to the Fugacity capacity of a chemical in the fish, P Fish is equal to the density of the fish (mass/length 3), BCF is the partition coefficient between the fish and the water (length 3 /mass) and H is equal to the Henry's law constant (Length 2 /Time 2) [6]
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The sample size is relatively large (say, n > 10— ¯ and R charts are typically used for smaller sample sizes) The sample size is variable; Computers can be used to ease the burden of calculation; The "chart" actually consists of a pair of charts: One to monitor the process standard deviation and another to monitor the process mean, as is ...
The sample size is relatively small (say, n ≤ 10— ¯ and s charts are typically used for larger sample sizes) The sample size is constant; Humans must perform the calculations for the chart; As with the ¯ and s and individuals control charts, the ¯ chart is only valid if the within-sample variability is constant. [4]
Shewhart individuals control chart. In statistical quality control, the individual/moving-range chart is a type of control chart used to monitor variables data from a business or industrial process for which it is impractical to use rational subgroups. [1] The chart is necessary in the following situations: [2]: 231.
In statistical quality control, the p-chart is a type of control chart used to monitor the proportion of nonconforming units in a sample, where the sample proportion nonconforming is defined as the ratio of the number of nonconforming units to the sample size, n. [1] The p-chart only accommodates "pass"/"fail"-type inspection as determined by ...
A 1951 USAF resolution test chart is a microscopic optical resolution test device originally defined by the U.S. Air Force MIL-STD-150A standard of 1951. The design provides numerous small target shapes exhibiting a stepped assortment of precise spatial frequency specimens. It is widely used in optical engineering laboratory work to analyze and ...
High-temperature operating life. High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested ...