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  2. Electrostatic fieldmeter - Wikipedia

    en.wikipedia.org/wiki/Electrostatic_Fieldmeter

    An electrostatic fieldmeter, also called a static meter is a tool used in the static control industry. It is used for non-contact measurement of electrostatic charge on an object. It measures the force between the induced charges in a sensor and the charge present on the surface of an object.

  3. QBD (electronics) - Wikipedia

    en.wikipedia.org/wiki/QBD_(electronics)

    QBD is the term applied to the charge-to-breakdown measurement of a semiconductor device. It is a standard destructive test method used to determine the quality of gate oxides in MOS devices. It is equal to the total charge passing through the dielectric layer (i.e. electron or hole fluence multiplied by the elementary charge) just before failure.

  4. Battery tester - Wikipedia

    en.wikipedia.org/wiki/Battery_tester

    Battery tester. A battery tester is an electronic device intended for testing the state of an electric battery, going from a simple device for testing the charge actually present in the cells and/or its voltage output, to a more comprehensive testing of the battery's condition, namely its capacity for accumulating charge and any possible flaws affecting the battery's performance and security.

  5. Coulometry - Wikipedia

    en.wikipedia.org/wiki/Coulometry

    Coulometry is the measure of charge, thus named after its unit the coulomb. Michael Faraday, known for his work in electricity and magnetism, made critical contributions to the field of electrochemistry. He discovered the laws of electrolysis, and in his recognition is the eponym of the Faraday constant.

  6. Coulombmeter - Wikipedia

    en.wikipedia.org/wiki/Coulombmeter

    The inner electrode, which is electrically isolated from the shield, is connected to a meter to measure the charge. [1] In the field of semiconductor design, a coulombmeter consists of a meter used in combination with a metal probe tip to pinpoint locations of excess charge on, for instance a semiconductor device. This application of a ...

  7. Electrical isolation test - Wikipedia

    en.wikipedia.org/wiki/Electrical_isolation_test

    The test often reveals problems that occurred during assembly, such as defective components, improper component placement, and insulator defects that may cause inadvertent shorting or grounding to chassis, in turn, compromising electrical circuit quality and product safety.

  8. Charge-coupled device - Wikipedia

    en.wikipedia.org/wiki/Charge-coupled_device

    In a peristaltic charge-coupled device, the charge-packet transfer operation is analogous to the peristaltic contraction and dilation of the digestive system. The peristaltic CCD has an additional implant that keeps the charge away from the silicon/silicon dioxide interface and generates a large lateral electric field from one gate to the next ...

  9. Source measure unit - Wikipedia

    en.wikipedia.org/wiki/Source_measure_unit

    I and V sweeping—Sweep capabilities offer a way to test devices under a range of conditions with different source, delay and measure characteristics. These can include fixed level, linear/log and pulsed sweeps. On-board processor—Some SMUs further improve instrument integration, communication and test time by adding an on-board script ...