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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
A ray of light is characterized by the direction normal to the wave front (wave normal). When a ray encounters a surface, the angle that the wave normal makes with respect to the surface normal is called the angle of incidence and the plane defined by both directions is the plane of incidence. Reflection of the incident ray also occurs in the ...
The angle of incidence, in geometric optics, is the angle between a ray incident on a surface and the line perpendicular (at 90 degree angle) to the surface at the point of incidence, called the normal. The ray can be formed by any waves, such as optical, acoustic, microwave, and X-ray. In the figure below, the line representing a ray makes an ...
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X-ray reflectometry: is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. Propagation of electric pulses and reflection at discontinuities in cables is used in time domain reflectometry (TDR) to detect and localize defects in electric wiring.
X-ray optics is the branch of optics dealing with X-rays, rather than visible light. It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction , X-ray crystallography , X-ray fluorescence , small-angle X-ray scattering , X-ray microscopy , X-ray phase-contrast imaging , and X-ray ...
Then the xz plane is the interface, and the y axis is normal to the interface (see diagram). Let i and j (in bold roman type) be the unit vectors in the x and y directions, respectively. Let the plane of incidence be the xy plane (the plane of the page), with the angle of incidence θ i measured from j towards i.
Reflectivity of X-rays is low, regardless of the used material and therefore, grazing incidence upon the grating is necessary. X-ray beams impinging on a smooth surface at a few degrees glancing angle of incidence undergo external total reflection which is taken advantage of to enhance the instrumental efficiency substantially.