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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
Propagation of a ray through a layer. The transfer-matrix method is a method used in optics and acoustics to analyze the propagation of electromagnetic or acoustic waves through a stratified medium; a stack of thin films. [1] [2] This is, for example, relevant for the design of anti-reflective coatings and dielectric mirrors.
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...
X-ray reflectometry: is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. Propagation of electric pulses and reflection at discontinuities in cables is used in time domain reflectometry (TDR) to detect and localize defects in electric wiring. [2] [3]
Grazing-incidence small-angle scattering (GISAS) a hybrid approach using small scattering (diffraction) angles with X-rays or neutrons. [5] X-ray reflectivity, yet another related technique, but here the intensity of the specular reflected beam is measured. [6] [7] [8]
X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
The angle of incidence, in geometric optics, is the angle between a ray incident on a surface and the line perpendicular (at 90 degree angle) to the surface at the point of incidence, called the normal. The ray can be formed by any waves, such as optical, acoustic, microwave, and X-ray. In the figure below, the line representing a ray makes an ...
An X-ray spectrograph consists of a high voltage power supply (50 kV or 100 kV), a broad band X-ray tube, usually with a tungsten anode and a beryllium window, a specimen holder, an analyzing crystal, a goniometer, and an X-ray detector device. These are arranged as shown in Fig. 1.