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PDFedit is a free PDF editor for Unix-like operating systems (including Cygwin on top of Windows). It does not support editing protected or encrypted PDF files or word processor-style text manipulation, however. [1] PDFedit GUI is based on the Qt 3 toolkit and scripting engine , so every operation is scriptable.
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
a Phylogenetic tReE viSualisaTion. Taxonium [15] web-based tool for exploration of very large trees including those with millions of nodes, with search and metadata coloring. When provided with a mutation-annotated tree, it illustrates mutations on the tree and displays final genotypes. T-REX (Webserver) [16]
Adobe Systems's Graphic Design software and image editor. Bluebeam Revu: Proprietary: A commercial PDF editor, markup and collaboration product aimed at engineering and architectural markets. Foxit Reader: Freeware: Highlight text, draw lines, measure distances of PDF documents. Foxit PDF Editor Suite: Free trial: Integrated PDF Editing and ...
Electron channelling contrast imaging (ECCI) is a scanning electron microscope (SEM) diffraction technique used in the study of defects in materials. These can be dislocations or stacking faults that are close to the surface of the sample, low angle grain boundaries or atomic steps.
The use of diffraction patterns as a function of position dates back to the earliest days of STEM, for instance the early review of John M. Cowley and John C. H. Spence in 1978 [2] or the analysis in 1983 by Laurence D. Marks and David J. Smith of the orientation of different crystalline segments in nanoparticles. [3]
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Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is most commonly used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties.