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Programmable built-in self-test (pBIST) Memory built-in self-test (mBIST) - e.g. with the Marinescu algorithm [2] Logic built-in self-test (LBIST) Analog and mixed-signal built-in self-test (AMBIST) Continuous built-in self-test (CBIST, C-BIT) Event-driven built-in self-test, such as the BIST done to an aircraft's systems after the aircraft lands.
The main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins, and thus unreachable by external automated test equipment. Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built-in self test or power-on self test of the finished product.
A power-on self-test (POST) is a process performed by firmware or software routines immediately after a computer or other digital electronic device is powered on. [ 1 ] POST processes may set the initial state of the device from firmware and detect if any hardware components are non-functional.
Programmable Built-In Self-Test (PBIST) is a memory DFT feature that incorporates all the required test systems into the chip itself. The test systems implemented on-chip are as follows: algorithmic address generator; algorithmic data generator; program storage unit; loop control mechanisms
When combined with built-in self-test , the JTAG scan chain enables a low overhead, embedded solution to test an IC for certain static faults (shorts, opens, and logic errors). The scan chain mechanism does not generally help diagnose or test for timing, temperature or other dynamic operational errors that may occur.
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Automatic test pattern generation or ATPG – The generation of pattern data systematically to exercise as many logic-gates and other components as possible. Built-in self-test or BIST – The installation of self-contained test-controllers to automatically test a logic or memory structure in the design
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related to: dell built in self test