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The tester has all these features and can check solid-state devices in and out of circuit. Transistor h fe varies fairly widely with Ic, so measurements with the service type tester give readings that can differ quite a bit from the h fe in the transistor's real life application.
In addition to the transistor characteristic curves, the Type 575 is used to display dynamic characteristics of a wide range of semiconductor devices." (Tektronix, Catalog, 1967) A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components , such as diodes , transistors ...
Creates constant-amplitude variable frequency sine waves to test frequency response Transistor tester: Tests transistors Tube tester: Tests vacuum tubes (triode, tetrode etc.) Wattmeter: Measures power in a circuit Vectorscope: Displays the phase of the colors in color TV Video signal generator: Generates video signal for testing purposes Voltmeter
An LCR meter is a type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component. [1] In the simpler versions of this instrument the impedance was measured internally and converted for display to the corresponding capacitance or inductance value. Readings should be reasonably ...
The 2N3055 is a silicon NPN power transistor intended for general purpose applications. It was introduced in the early 1960s by RCA using a hometaxial power transistor process, transitioned to an epitaxial base in the mid-1970s. [1] Its numbering follows the JEDEC standard. [2] It is a transistor type of enduring popularity. [3] [4] [5]
While not a replacement for a proper transistor tester, and most certainly not for a swept curve tracer type, this facilitates testing diodes and a variety of transistor types. [26] A graphic representation of the quantity under test, as a bar graph. This makes go/no-go testing easy, and also allows spotting of fast-moving trends.
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
First edition. Electrons and Holes in Semiconductors with Applications to Transistor Electronics is a book by Nobel Prize winner William Shockley, [1] first published in 1950. . It was a primary source, and was used as the first textbook, for scientists and engineers learning the new field of semiconductors as applied to the development of the transis