Search results
Results from the WOW.Com Content Network
XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource
Small-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes and characteristic distances of partially ordered materials. [1]
X-ray absorption near edge structure (XANES), also known as near edge X-ray absorption fine structure (NEXAFS), is a type of absorption spectroscopy that indicates the features in the X-ray absorption spectra of condensed matter due to the photoabsorption cross section for electronic transitions from an atomic core level to final states in the energy region of 50–100 eV above the selected ...
X-ray diffraction (XRD) is still the most used method for structural analysis of chemical compounds. Yet, with increasing detail on the relation of K β {\displaystyle K_{\beta }} -line spectra and the surrounding chemical environment of the ionized metal atom, measurements of the so-called valence-to-core (V2C) energy region become ...
CompuServe was initiated during 1969 as Compu-Serv Network, Inc. [a] in Columbus, Ohio, as a subsidiary of Golden United Life Insurance. [5]Though Golden United founder Harry Gard Sr.'s son-in-law Jeffrey Wilkins is widely miscredited as the first president of CompuServe, its first president was actually John R. Goltz. [6]
The U.S. management did not want the laboratory to be converted to a manufacturing unit so it decided to set up a commercial unit to further develop the X-ray instrumentation market. In 1953 Norelco Electronics was established in Mount Vernon, NY, dedicated to the sale and support of X-ray instrumentation.
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
The result is that the crystallinity will never reach 100%. Powder XRD can be used to determine the crystallinity by comparing the integrated intensity of the background pattern to that of the sharp peaks. Values obtained from powder XRD are typically comparable but not quite identical to those obtained from other methods such as DSC.