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The scanning helium microscope (SHeM) is a form of microscopy that uses low-energy (5–100 meV) neutral helium atoms to image the surface of a sample without any damage to the sample caused by the imaging process. Since helium is inert and neutral, it can be used to study delicate and insulating surfaces.
A scanning helium ion microscope (SHIM, HeIM or HIM) is an imaging technology based on a scanning helium ion beam. [2] Similar to other focused ion beam techniques, it allows to combine milling and cutting of samples with their observation at sub-nanometer resolution.
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Scanning helium microscope may refer to: Scanning helium microscopy; Scanning Helium Ion Microscope; Atomic nanoscope, which was proposed and discussed in the literature, but is not yet competitive with optical microscope, electron microscope, Scanning Helium Ion Microscope and various scanning probe microscopes
Field ion microscope image of the end of a sharp platinum needle. Each bright spot is a platinum atom. The field-ion microscope (FIM) was invented by Müller in 1951. [1] It is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip.
A set of standard 75 by 25 mm microscope slides. The white area can be written on to label the slide. A microscope slide (top) and a cover slip (bottom) A microscope slide is a thin flat piece of glass, typically 75 by 26 mm (3 by 1 inches) and about 1 mm thick, used to hold objects for examination under a microscope.