Search results
Results from the WOW.Com Content Network
A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements such as: high reliability; lower repair cycle times; or constraints such as: limited technician accessibility; cost of testing during manufacture
The main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins, and thus unreachable by external automated test equipment. Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built-in self test or power-on self test of the finished product.
The final result of the PBIST test is read out through the Test Data Output (TDO) pin. PBIST supports the entire algorithmic memory testing requirements imposed by the production testing methodology. In order to support all of the required test algorithms, PBIST must have the capability to store the required programs locally in the device.
The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.
JTAG (named after the Joint Test Action Group which codified it) is an industry standard for verifying designs of and testing printed circuit boards after manufacture. JTAG implements standards for on-chip instrumentation in electronic design automation (EDA) as a complementary tool to digital simulation . [ 1 ]
Burn-in on a monitor, when severe as in this "please wait" message, is visible even when the monitor is switched off. Screen burn-in, image burn-in, ghost image, or shadow image, is a permanent discoloration of areas on an electronic visual display such as a cathode-ray tube (CRT) in an older computer monitor or television set.
Major technologies are CRT, LCD and its derivatives (Quantum dot display, LED backlit LCD, WLCD, OLCD), Plasma, and OLED and its derivatives (Transparent OLED, PMOLED, AMOLED). An emerging technology is Micro LED. Cancelled and now obsolete technologies are SED and FED.
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.